Karim Mohammadi, Hadi Jahanirad, Pejman Attarsharghi. Fast Reliability Analysis Method for Sequential Logic Circuits. In Henry Selvaraj, Dawid Zydek, editors, 21st International Conference on Systems Engineering (ICSEng 2011), Las Vegas, NV, USA, Aug. 16-18, 2011. pages 352-356, IEEE, 2011. [doi]
Abstract is missing.