A testing scheme for mixed-control based reversible circuits

Bappaditya Mondal, Chandan Bandyopadhyay, Hafizur Rahaman. A testing scheme for mixed-control based reversible circuits. In Sixth International Symposium on Embedded Computing and System Design, ISED 2016, Patna, India, December 15-17, 2016. pages 96-100, IEEE, 2016. [doi]

Abstract

Abstract is missing.