Bappaditya Mondal, Chandan Bandyopadhyay, Hafizur Rahaman. Detection and localization of appearance faults in reversible circuits. In 7th International Symposium on Embedded Computing and System Design, ISED 2017, Durgapur, India, December 18-20, 2017. pages 1-5, IEEE, 2017. [doi]
Abstract is missing.