Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das. Boolean Difference Technique for Detecting All Missing Gate Faults in Reversible Circuits. In Zoran Stamenkovic, Witold A. Pleskacz, Jaan Raik, Heinrich Theodor Vierhaus, editors, 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2015, Belgrade, Serbia, April 22-24, 2015. pages 95-98, IEEE, 2015. [doi]
Abstract is missing.