Akito Monden, Daikai Nakae, Toshihiro Kamiya, Shin-ichi Sato, Ken-ichi Matsumoto. Software Quality Analysis by Code Clones in Industrial Legacy Software. In 8th IEEE International Software Metrics Symposium (METRICS 2002), 4-7 June 2002, Ottawa, Canada. pages 87, IEEE Computer Society, 2002. [doi]
Abstract is missing.