Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study

B. Mongellaz, F. Marc, Y. Danto. Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. Microelectronics Reliability, 43(9-11):1513-1518, 2003. [doi]

Abstract

Abstract is missing.