Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen. Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring. In 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.