Ginette Monté, Bernard Antaki, Serge Patenaude, Yvon Savaria, Claude Thibeault, Pieter M. Trouborst. Tools for the Characterization of Bipolar CML Testability. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 388-395, IEEE Computer Society, 2001. [doi]
Abstract is missing.