D. Monti, Matteo Meneghini, Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni, A. Bojarska, Piotr Perlin. Long-term degradation of InGaN-based laser diodes: Role of defects. Microelectronics Reliability, 76:584-587, 2017. [doi]
@article{MontiMSMZBP17,
title = {Long-term degradation of InGaN-based laser diodes: Role of defects},
author = {D. Monti and Matteo Meneghini and Carlo De Santi and Gaudenzio Meneghesso and Enrico Zanoni and A. Bojarska and Piotr Perlin},
year = {2017},
doi = {10.1016/j.microrel.2017.06.043},
url = {https://doi.org/10.1016/j.microrel.2017.06.043},
researchr = {https://researchr.org/publication/MontiMSMZBP17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {584-587},
}