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Statistical Characterization of Noise and Interference in NAND Flash Memory

Jaekyun Moon, Jaehyeong No, SangChul Lee, Sangsik Kim, Seokhwan Choi, Yunheub Song. Statistical Characterization of Noise and Interference in NAND Flash Memory. IEEE Trans. on Circuits and Systems, 60-I(8):2153-2164, 2013. [doi]

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