Thomas Moon, Nicholas Tzou, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee. Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 146-151, IEEE, 2012. [doi]
Abstract is missing.