GIS analysis of U.S. patent data: examining local innovation patterns

Jon Moore, Qian Cui. GIS analysis of U.S. patent data: examining local innovation patterns. In Lindi Liao, editor, Proceedings of the 2nd International Conference and Exhibition on Computing for Geospatial Research & Application, COM.Geo 2011, Washington, DC, USA, May 23-25, 2011. ACM International Conference Proceeding Series, pages 19, ACM, 2011. [doi]

@inproceedings{MooreC11-0,
  title = {GIS analysis of U.S. patent data: examining local innovation patterns},
  author = {Jon Moore and Qian Cui},
  year = {2011},
  doi = {10.1145/1999320.1999339},
  url = {http://doi.acm.org/10.1145/1999320.1999339},
  tags = {analysis, data-flow analysis},
  researchr = {https://researchr.org/publication/MooreC11-0},
  cites = {0},
  citedby = {0},
  pages = {19},
  booktitle = {Proceedings of the 2nd International Conference and Exhibition on Computing for Geospatial Research & Application, COM.Geo 2011,  Washington, DC, USA, May 23-25, 2011},
  editor = {Lindi Liao},
  series = {ACM International Conference Proceeding Series},
  publisher = {ACM},
  isbn = {978-1-4503-0681-2},
}