Sandeep Moparthi, Pramod Kumar Tiwari, Gopi Krishna Saramekala. Genetic algorithm-based threshold voltage prediction of SOI JLT using multi-variable nonlinear regression. In 4th International Symposium on Devices, Circuits and Systems, ISDCS 2021, Higashi-Hiroshima, Japan, March 3-5, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.