28nm UTBB FDSOI product reliability/performance trade-off optimization through body bias operation

P. Mora, X. Federspiel, F. Cacho, V. Huard, W. Arfaoui. 28nm UTBB FDSOI product reliability/performance trade-off optimization through body bias operation. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 6, IEEE, 2015. [doi]

Abstract

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