Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver

Arya Moradinia, Rafael P. Martinez, Jeffrey W. Teng, Nelson SepĂșlveda-Ramos, Harrison Lee, John D. Cressler. Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2020, Monterey, CA, USA, November 16-19, 2020. pages 1-5, IEEE, 2020. [doi]

Abstract

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