Frédéric Morain-Nicolier, Jérôme Landré, Su Ruan. Binary pattern matching from a local dissimilarity measure. In Khalifa Djemal, Mohamed Deriche, editors, 2nd International Conference on Image Processing Theory Tools and Applications, IPTA 2010, 7-10 July, 2010, Paris, France. pages 417-420, IEEE, 2010. [doi]
Abstract is missing.