Jose Moreira, Heidi Barnes, Guenter Hoersch. Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
Abstract is missing.