Jose Moreira, Heidi Barnes, Hiroshi Kaga, Michael Comai, Bernhard Roth, Morgan Culver. Beyond 10 Gbps? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
Abstract is missing.