Electromagnetic Fault Injection: Towards a Fault Model on a 32-bit Microcontroller

Nicolas Moro, Amine Dehbaoui, Karine Heydemann, Bruno Robisson, Emmanuelle Encrenaz. Electromagnetic Fault Injection: Towards a Fault Model on a 32-bit Microcontroller. In Wieland Fischer, Jörn-Marc Schmidt, editors, 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, Los Alamitos, CA, USA, August 20, 2013. pages 77-88, IEEE, 2013. [doi]

@inproceedings{MoroDHRE13,
  title = {Electromagnetic Fault Injection: Towards a Fault Model on a 32-bit Microcontroller},
  author = {Nicolas Moro and Amine Dehbaoui and Karine Heydemann and Bruno Robisson and Emmanuelle Encrenaz},
  year = {2013},
  doi = {10.1109/FDTC.2013.9},
  url = {http://dx.doi.org/10.1109/FDTC.2013.9},
  researchr = {https://researchr.org/publication/MoroDHRE13},
  cites = {0},
  citedby = {0},
  pages = {77-88},
  booktitle = {2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, Los Alamitos, CA, USA, August 20, 2013},
  editor = {Wieland Fischer and Jörn-Marc Schmidt},
  publisher = {IEEE},
  isbn = {978-0-7695-5059-6},
}