Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique - researchr publication related

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Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, G. J. Papaioannou, A. Arapoyanni, Apostolos T. Voutsas. Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Microelectronics Reliability, 48(8-9):1544-1548, 2008. [doi]

The following publications are possibly variants of this publication:

Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniquesDespina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, G. J. Papaioannou, Apostolos T. Voutsas. mr, 47(9-11):1378-1383, 2007. [doi]

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