Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques

Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, G. J. Papaioannou, Apostolos T. Voutsas. Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques. Microelectronics Reliability, 47(9-11):1378-1383, 2007. [doi]

@article{MoschouEKPV07,
  title = {Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques},
  author = {Despina C. Moschou and M. A. Exarchos and Dimitrios N. Kouvatsos and G. J. Papaioannou and Apostolos T. Voutsas},
  year = {2007},
  doi = {10.1016/j.microrel.2007.07.073},
  url = {http://dx.doi.org/10.1016/j.microrel.2007.07.073},
  tags = {C++, reliability},
  researchr = {https://researchr.org/publication/MoschouEKPV07},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {47},
  number = {9-11},
  pages = {1378-1383},
}