Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays

Seyedhamidreza Motaman, Swaroop Ghosh. Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-2, ACM, 2014. [doi]

Abstract

Abstract is missing.