Seyedhamidreza Motaman, Swaroop Ghosh. Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-2, ACM, 2014. [doi]
@inproceedings{MotamanG14, title = {Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays}, author = {Seyedhamidreza Motaman and Swaroop Ghosh}, year = {2014}, doi = {10.1145/2593069.2593216}, url = {http://doi.acm.org/10.1145/2593069.2593216}, researchr = {https://researchr.org/publication/MotamanG14}, cites = {0}, citedby = {0}, pages = {1-2}, booktitle = {The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014}, publisher = {ACM}, isbn = {978-1-4503-2730-5}, }