Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays

Seyedhamidreza Motaman, Swaroop Ghosh. Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-2, ACM, 2014. [doi]

@inproceedings{MotamanG14,
  title = {Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays},
  author = {Seyedhamidreza Motaman and Swaroop Ghosh},
  year = {2014},
  doi = {10.1145/2593069.2593216},
  url = {http://doi.acm.org/10.1145/2593069.2593216},
  researchr = {https://researchr.org/publication/MotamanG14},
  cites = {0},
  citedby = {0},
  pages = {1-2},
  booktitle = {The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014},
  publisher = {ACM},
  isbn = {978-1-4503-2730-5},
}