Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang. Convolutional compaction-driven diagnosis of scan failures. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 176-181, IEEE, 2005. [doi]
Abstract is missing.