Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer. High Speed Ring Generators and Compactors of Test Data. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 57-62, IEEE Computer Society, 2003. [doi]
Abstract is missing.