Design of a Process Variation Tolerant Self-Repairing SRAM for Yield Enhancement in Nanoscaled CMOS

Saibal Mukhopadhyay, Keejong Kim, Hamid Mahmoodi, Kaushik Roy 0001. Design of a Process Variation Tolerant Self-Repairing SRAM for Yield Enhancement in Nanoscaled CMOS. J. Solid-State Circuits, 42(6):1370-1382, 2007. [doi]

Abstract

Abstract is missing.