Saibal Mukhopadhyay, Arijit Raychowdhury, Hamid Mahmoodi-Meimand, Kaushik Roy. Leakage Current Based Stabilization Scheme for Robust Sense-Amplifier Design for Yield Enhancement in Nano-scale SRAM. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 176-181, IEEE Computer Society, 2005. [doi]
Abstract is missing.