Deep Deterministic Uncertainty: A New Simple Baseline

Jishnu Mukhoti, Andreas Kirsch 0002, Joost van Amersfoort, Philip H. S. Torr, Yarin Gal. Deep Deterministic Uncertainty: A New Simple Baseline. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 24384-24394, IEEE, 2023. [doi]

Authors

Jishnu Mukhoti

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Andreas Kirsch 0002

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Joost van Amersfoort

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Philip H. S. Torr

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Yarin Gal

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