Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee. Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 96-101, IEEE Computer Society, 2016. [doi]
Abstract is missing.