External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware

Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee. Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 403-408, IEEE Computer Society, 2017. [doi]

Abstract

Abstract is missing.

runs on