S. Musibau, N. Poumpouridis, Artemisia Tsiara, J. Franco, Mathias Berciano, Joris Van Campenhout, I. De Wout, K. Crees. Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors. In IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024. pages 1-10, IEEE, 2024. [doi]
Abstract is missing.