Kris Myny, Monique J. Beenhakkers, Nick A. J. M. van Aerle, Gerwin H. Gelinck, Jan Genoe, Wim Dehaene, Paul Heremans. Robust digital design in organic electronics by dual-gate technology. In IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010. pages 140-141, IEEE, 2010. [doi]
Abstract is missing.