An embedded technique for at-speed interconnect testing - researchr publication

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Benoit Nadeau-Dostie, Jean-Francois Cote, Harry Hulvershorn, Stephen Pateras. An embedded technique for at-speed interconnect testing. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 431-438, IEEE Computer Society, 1999.

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