Static analysis tools as early indicators of pre-release defect density

Nachiappan Nagappan, Thomas Ball. Static analysis tools as early indicators of pre-release defect density. In Gruia-Catalin Roman, William G. Griswold, Bashar Nuseibeh, editors, 27th International Conference on Software Engineering (ICSE 2005), 15-21 May 2005, St. Louis, Missouri, USA. pages 580-586, ACM, 2005. [doi]

Abstract

Abstract is missing.