Nachiappan Nagappan, Laurie Williams, Mladen A. Vouk, Jason Osborne. Using In-Process Testing Metrics to Estimate Post-Release Field Quality. In ISSRE 2007, The 18th IEEE International Symposium on Software Reliability, Trollhättan, Sweden, 5-9 November 2007. pages 209-214, IEEE Computer Society, 2007. [doi]
Abstract is missing.