Armin Najafi, Peter C. Rigby, Weiyi Shang. Bisecting commits and modeling commit risk during testing. In Marlon Dumas, Dietmar Pfahl, Sven Apel, Alessandra Russo, editors, Proceedings of the ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/SIGSOFT FSE 2019, Tallinn, Estonia, August 26-30, 2019. pages 279-289, ACM, 2019. [doi]
Abstract is missing.