Hiromi Nakagawa, Yusuke Iwasawa, Yutaka Matsuo. End-to-End Deep Knowledge Tracing by Learning Binary Question-Embedding. In Hanghang Tong, Zhenhui Jessie Li, Feida Zhu, Jeffrey Yu, editors, 2018 IEEE International Conference on Data Mining Workshops, ICDM Workshops, Singapore, Singapore, November 17-20, 2018. pages 334-342, IEEE, 2018. [doi]
Abstract is missing.