Hold violation analysis for functional test of ultra-low temperature circuits at room temperature

Takahiro Nakayama, Masanori Hashimoto. Hold violation analysis for functional test of ultra-low temperature circuits at room temperature. In 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018. pages 1-4, IEEE, 2018. [doi]

Abstract

Abstract is missing.