Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature

Takahiro Nakayama, Masanori Hashimoto. Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature. IEICE Transactions, 102-A(7):914-917, 2019. [doi]

Abstract

Abstract is missing.