Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature

Takahiro Nakayama, Masanori Hashimoto. Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature. IEICE Transactions, 102-A(7):914-917, 2019. [doi]

@article{NakayamaH19-0,
  title = {Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature},
  author = {Takahiro Nakayama and Masanori Hashimoto},
  year = {2019},
  url = {http://search.ieice.org/bin/summary.php?id=e102-a_7_914},
  researchr = {https://researchr.org/publication/NakayamaH19-0},
  cites = {0},
  citedby = {0},
  journal = {IEICE Transactions},
  volume = {102-A},
  number = {7},
  pages = {914-917},
}