Nidhi Nasiar, Ryan S. Baker, Jillian Li, Weiyi Gong. How do A/B Testing and Secondary Data Analysis on AIED Systems Influence Future Research?. In Maria Mercedes Rodrigo, Noburu Matsuda, Alexandra I. Cristea, Vania Dimitrova, editors, Artificial Intelligence in Education - 23rd International Conference, AIED 2022, Durham, UK, July 27-31, 2022, Proceedings, Part I. Volume 13355 of Lecture Notes in Computer Science, pages 115-126, Springer, 2022. [doi]
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