High temperature reliability of μtrench Phase-Change Memory devices

Gabriele Navarro, S. Souiki, A. Persico, V. Sousa, J.-F. Nodin, Carine Jahan, F. Aussenac, V. Delaye, O. Cueto, L. Perniola, B. De Salvo. High temperature reliability of μtrench Phase-Change Memory devices. Microelectronics Reliability, 52(9-10):1928-1931, 2012. [doi]

Abstract

Abstract is missing.