Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran. Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 97-102, IEEE Computer Society, 2004. [doi]
Abstract is missing.