Simulation-Based Design Error Diagnosis and Correction in Combinational Digital Circuits

Debashis Nayak, D. M. H. Walker. Simulation-Based Design Error Diagnosis and Correction in Combinational Digital Circuits. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 70-79, IEEE Computer Society, 1999. [doi]

Abstract

Abstract is missing.