General Testers for Asynchronous Circuits

Radu Negulescu. General Testers for Asynchronous Circuits. In 10th International Symposium on Advanced Research in Asynchronous Circuits and Systems (ASYNC 2004), 19-23 April 2004, Crete, Greece. pages 28-38, IEEE Computer Society, 2004. [doi]

Abstract

Abstract is missing.