Michael Nelhiebel, Robert Illing, C. Schreiber, S. Wöhlert, S. Lanzerstorfer, Markus Ladurner, C. Kadow, Stefan Decker, D. Dibra, H. Unterwalcher, M. Rogalli, W. Robl, T. Herzig, M. Poschgan, M. Inselsbacher, Michael Glavanovics, Sylvain Fraïssé. A reliable technology concept for active power cycling to extreme temperatures. Microelectronics Reliability, 51(9-11):1927-1932, 2011. [doi]
Abstract is missing.