Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer. Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers, 23(5):390-400, 2006. [doi]
Abstract is missing.