Built-in Self-Repair in a 3D die stack using programmable logic

Kundan Nepal, Xi Shen, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar. Built-in Self-Repair in a 3D die stack using programmable logic. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 243-248, IEEE, 2013. [doi]

Abstract

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