Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker 0001, Matthias Sauer 0002. Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.