Defect count prediction via metric-based convolutional neural network - researchr publication references

researchr

You are not signed in
Sign in
Sign up

Meetesh Nevendra, Pradeep Singh. Defect count prediction via metric-based convolutional neural network. Neural Computing and Applications, 33(22):15319-15344, 2021. [doi]

No references recorded for this publication.

No citations of this publication recorded.

runs on WebDSL